RF Test and Measurement

This application note from Agilent describes the challenges of measuring distortion products from your device under test. The challenges arise from the need to measure weak distortion product and harmonic signals in the presence of strong carrier signals, combined with the fact that the analog components in the test instrumentation produce their own unwanted distortion signals.

This application note, Measuring the Nonlinearities of RF Amplifiers Using Signal Generators and a Spectrum Analyzer, from Rohde-Schwarz covers the measurement of amplifier nonlinearities. It includes a very useful discussion of the relationship between harmonics and their intermodulation products. Particularly, the ratio between the second harmonic intercept point and IP2 is described. Several useful figures are supplied to aid understanding.

These notes from a seminar given by HP in the mid-80's serve as a useful reference for some of the fundamental relationships governing phase noise. Needless to say, some of the most recent techniques in phase noise measurements are not represented, but the mechanisms that generate phase noise are described in useful detail.

This is a detailed article comparing phase noise measurement techniques and their advantages and disadvantages. You will need to be a member of the Microwave Theory and Techniques society of the IEEE to view the article for free. A purchase option may be available if you are not a member.

In this tutorial from High Frequency Electronics magazine, Anthony Bichler describes a technique to achieve broadband matching networks using the Smith Chart. The tutorial article also includes a review of Smith Chart fundamentals. The technique that is described goes beyond simply keeping the quality factor of the network to a minimum.

This PDF guide from Huber+Suhner is a comprehensive look at connector performance issues. Many popular RF connector types are also described.

Covers resolution bandwidth, cable losses, low level signals, dynamic range, internal distortion products, optimizing speed for transients, selecting display detectors, and time gating.
From Agilent (AN-1286-1)

Explanation and derivation of the VNA 12- and 8-term calibration error models. Presentation slides from a conference paper by Doug Rytting.

This tutorial provides a good overview of different RF connector types and their history.