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Near-field scanners let you see EMI

Article by instructor Arturo Mediano about near-field scanners.

I love near field probes because they let me "see" magnetic and electric fields with an oscilloscope or with a spectrum analyzer. They let locate sources of emissions in board, cables, and systems. Near-field scanners also let you see emissions, particularly all over a board. That's hard to do with a single probe.

Author
Arturo Mediano

Interference Technology Magazine

Established in 1970, Interference Technology helps EMI/EMC engineers find solutions to their various testing, design, application and regulatory issues by publishing articles, news and other practical content. We help suppliers in these areas to find the right customers for their components, materials, test equipment and services through a wide range of marketing services, including lead generation, branding, market research and events.

Author
ITEM Media

Comparison of USB Chargers (Apple, Samsung, Counterfeit)

This blog post is a few years old, but remains very interesting to see the difference in performance among USB wall chargers. Ever wonder about the difference between the expensive name-brand charger and the cheap imitation? This article gives in depth examination of the noise emanating from these devices. An interesting side effect of unwanted electrical noise from the chargers is that the touch-screen on your device can become unresponsive or erratic in some cases.

Author
Ken Shirriff

The Effect of DC/LF Current in Ferrites for EMI

Arturo Mediano teaches courses on EMC/EMI and Signal Integrity for Besser Associates. He is a frequent contributor to industry magazines and journals on these topics. This article appears in the "Practical Tips" section of InCompliance magazine.

Ferrites for EMI suppression are usually chosen looking for high (resistive) impedance at the frequency of interest; but, sometimes, that ferrite is not working as expected. Perhaps you have saturation effects?

Author
Arturo Mediano

Noise Figure Measurement Accuracy – The Y-Factor Method

This app note gives some good background for improving the accuracy of noise figure measurements.

Some noteworthy topics covered include: when to use a noise source with a larger or smaller ENR, choosing the appropriate measurement bandwidth, and factors to take into account when making measurements on frequency-conversion devices (mixers).

Author
Keysight

The EMC Blog

Arturo Mediano is a professor at University of Zaragoza (Spain) and founder of The HF-Magic Lab®, a specialized laboratory for design, diagnostic, troubleshooting, and training in the EMI/EMC/SI and RF fields. He is also an instructor for Besser Associates (CA, USA) offering public and on site courses in EMI/EMC/SI/RF subjects.

Author
Arturo Mediano